WE HAVE MOVED!
Effective August 1, 2026, Burden & Hansen, LLC is pleased to announce our new office location:
10 John James Audubon Parkway
Suite 201
Amherst, NY 14228
All telephone numbers and email addresses remain unchanged.
We look forward to welcoming you to our new office.

Product Liability

An allegation that a product is defective can arise at any point along the distribution chain – from design and manufacture to supply and sale.

When a product becomes the target of a liability claim, it can bring negative publicity, business interruption and lengthy litigation.

Burden & Hansen, LLC represents clients involved in the design, manufacture and distribution of a wide variety of products, including, but not limited to, medical devices, chemical products/industrial cleaners, household products, electronic equipment, appliances, food products, complex industrial equipment, tools, furniture, playground equipment, sporting goods, automobiles and recreational vehicles.

Burden & Hansen, LLC has experience handling high exposure, complex catastrophic loss cases, including from product failure, use or misuse, chemical leak, fire and explosion. We have a dedicated group of attorneys who are available 24/7 to respond quickly to catastrophic accidents involving significant injuries and loss of life. Our attorneys handle on-the-scene investigation of losses, including retention and coordination of experts, preservation of evidence and management and coordination of a defense in the early stages after a major loss.

Product Liability cases can be complex and costly. When possible, we will work to resolve the matter early in the litigation process; however, if resolution is not possible, our litigators have extensive experience in taking a case to trial. We are knowledgeable in selecting the appropriate skilled and qualified expert witnesses, a critical task in defending against these claims. Through our involvement in national defense organizations, we have built strong relationships with experts across a wide range of fields.